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WELCOME TO THE ELECTRON MICROSCOPY FACILITY!
MAJOR ELECTRON MICROSCOPY EQUIPMENT
- JEOL JEM-2100 Electron Microscope (TEM/STEM)
- JEOL JIB-4500 Multi Beam System (FIB/SEM)
- RIMARY FUNDING FOR THE FACILITY WAS OBTAINED THROUGH A GRANT FROM
THE OHIO THIRD FRONTIER WRIGHT PROJECTS PROGRAM
LOCATION: Room 5035A, WBSH in the YSU Chemistry Department
OVERVIEW OF THE YSU WRIGHT PROJECT:
- Collaborative Effort Between YSU and Fireline TCON, Inc. Involving the Preparation, Characterization, and
- Commercialization of Ceramic-Composite Materials for Various Applications
- Another Collaborative Component Involves the Ohio Supercomputer Center to Develop a System Model
MAJOR EQUIPMENT FUNDED:
- JEOL 2010 Scanning/Transmission Electron Microscope (S/TEM)
- JEOL JIB 4500 Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
FUNDING CITATION:
OTF-WP 08-030: Center for Excellence in Advanced Materials Analysis, T.R. Wagner (PI/PD),
K.M. Peters (Fireline PI), D. Hudak, B. Hetzel, H. Marie, M. Zeller, A.D. Hunter, and C.S. Hirtzel,
Ohio Third Frontier, Wright Projects Program, 9/08 “ 9/11, $2,115,000, 2008-2011.
ANNOUNCEMENTS:
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