Located on First Floor, Ward Beecher Science Hall (Physics)
Atomic Force Microscope manufactured by Agilent (model 5500) located in room 1001on the 1st floor of Ward Beecher Science Hall. This instrument was acquired with funds from the Ohio Department of Development (Third Frontier Program). It is capable of measuring nanometer-scale (even subnanometer, in some cases) topographic, elastic, electric and chemical features of surfaces of soft and hard materials in air, through liquids, and under gas purge, including some caustic gas and liquid environments. In addition to the chemical and environmental control, the instrument also has temperature control stages from -30 oC to 250 oC and can be used to make in-situ measurements while the temperature or environment is changing. Available measurement modes: AC (tapping), magnetic AC, scanning tunneling microscopy (STM), piezo-response, phase imaging, current sensing, Lateral Force Microscopy, Electric Force Microscopy, Kelvin Force Microscopy, and Magnetic Force Microscopy. In addition, the AFM can be used for nanoimprinting/nanolithography.
Vibrant Nd:YAG-pumped Optical Parametric Oscillator. The VIBRANT is an integrated, turn-key tunable laser system that utilizes OPOTEK's patented OPO technology to generate a broad tuning range with a high conversion efficiency, with no wavelength gaps from the UV to 2.3 microns.
Magnetron Sputter Deposition system- manufactured by CVC (model SC-3000) pumped with a fomblin-charged mechanical pump and a liquid nitrogen-cooled diffusion pump. A pressure of 1 x 10-7 Torr can be achieved within 6 hours of pumping the 18 x 30 inches bell jar chamber. The system is configured with three 2-inch diameter sputter cathodes, a 500 DC and a 300 watt RF power supplies, two heaters (for temperatures up to 800 oC), an Infineon film thickness monitor and several high purity metallic and insulator sputter target materials.
Photoluminescence measurement system composed of a 55 mW He-Cd UV laser source (325 nm), PMT, a ¼ m monochromator and an assortment of laser beam steering optics and detection meters. For variable temperature measurements (10 – 300K), samples are mounted in a closed-cycle He refrigeration system.
Annealing Systems: Two annealing systems are available: (i) a rapid thermal processor (RTP) - Model RTP-300 that can accommodate up to 4-inch diameter wafers and can reach 1,000 oC, and (ii) a vacuum annealing system – manufactured by Key High Vacuum Products, Model KV-301 with a 12 x 18 inches bell jar chamber (base pressure < 1 x 10-8 Torr) which features a resistively heated carbon strip with an attached thermocouple for temperature monitoring and can reach 1,100 oC.
UV-mask aligner capable of resolving 2 μm features using standard photolithography.
Electrical Measurement – an Agilent Precision LCR meter (model E4980A, 20Hz – 2 MHz) for capacitance-voltage measurements and an assortment of Keithley meters for current-voltage measurements. A Nikon ME6 high power optical microscope mounted on a home-built probe station and a home-built heating stage for variable temperature electrical measurements are available.
Two spin coaters, two chemical fume hoods (with James Aldridge at work)
Shared Equipment: Fifth Floor Ward Beecher Science Hall (Chemistry)
Electron Microscopy Facility: The newly established facility is located in Ward Beecher Science Hall. Youngtown State University hired a new faculty member, Dr. Virgil Solomon, who is senior personnel on this proposal, to lead the facility. He will be assisted by another PhD level scientist who will be hired in the next months. Dr. Solomon obtained his PhD in Electron Microscopy from the Kumamoto University in Japan and worked as a postdoctoral fellow in the Center for Solid State Science and the Center for High Resolution Electron Microscopy at Arizona State University for several years. Until recently he managed the Electron Microscopy Facility at the University of Connecticut.
The Electron Microscopy Facility features:
A High Resolution Scanning Transmission Electron Microscope (JEOL JEM 2100), located in the newly established Electron Microscopy Facility in Ward Beecher Science Hall. It operates at an acceleration voltage of 200 kV and is equipped with a LaB6 electron gun, an X-ray Energy Dispersive Microanalysis System (EDS), two digital cameras, single and double-tilt holders, image analysis software package, etc. The instrument can attain a point resolution of 0.194 nm. The combined high resolution/analytical capabilities of the instrument make it particularly suitable for characterization of nanometer size structures.
A Focused Ion Beam (JIB 4500 MultiBeam), also from JEOL, equipped micromanipulator, gas injection systems and silicon drift detector X-ray energy dispersive spectrometer. It provides high resolution, 3-D imaging and analysis and is ideal for micrometer scale sample preparation for SEM and TEM, as well as micro-machining and nano-fabrication.
Scanning Electron Microscope (Cambridge Stereoscan 200) equipped with secondary and backscattered electron detectors and EDAX Genesis 2000 X-ray dispersive spectrometer.
Sample Preparation Equipment comprising Low Speed Diamond Wheel Saw (Struers-Acutom-2) for cutting samples from the bulk and grinding and polishing machines. Additional sample preparation equipment is available at the Center for Transportation and Materials engineering and in the Department of Geological and Environmental Sciences, both located in the Engineering Building across from Ward Beecher Science Hall.
The X-Ray Diffraction Laboratory features:
D8 advance diffractometer, the instrument most relevant for the current proposal, is equipped with a nine sample changer and is capable to collect data on samples from a few millimeters up to over an inch in diameter, and up to a thickness of several millimeters. It was recently upgraded with a Våntec area detector which allows collection of high quality data in much reduced time (for the ZnO samples, excellent data can be obtained in less than ten minutes).
S2 Ranger X-ray fluorescence spectrometer capable to detect elements sodium and heavier with intuitive touch-screen interface and a 28 position X-Y auto sampler for overnight or for remote access data collections.
SMART APEX CCD single crystal diffractometer
Rigaku Miniflex powder diffractometer